Signal test system, method and device, and oscilloscope
Source: EPO OPS
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Dossier Overview
Application number
CN202411188994
Inventor
DENG MINGYANG; KANG ZILING; LIN ZHEN; LIANG ZHIJUN; JI CUIPING
Filing Date
Aug 28, 2024
Publication Date
Sep 27, 2024
Patent Family ID
92818297
IPC Classification
CPC Classification
The invention provides a signal testing system, method and device and an oscilloscope. The signal testing system comprises an oscilloscope, a first probe and a second probe, the first probe is respectively connected with the oscilloscope and a test object; the first probe is used for collecting a first signal of a test object and transmitting the first signal to the oscilloscope; the second probe is connected with the oscilloscope; the second probe is used for collecting a signal in a test environment in which the test object is located and filtering the signal to obtain a second signal with the same bandwidth as the first signal, and transmitting the second signal to the oscilloscope; and the oscilloscope is used for correcting the first signal by using the second signal to obtain a third signal.
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