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PROCESS GAS MONITORING APPARATUS, VOLATILIZATION VESSEL, SUBSTRATE PROCESSING APPARATUS, AND METHOD

InventionPending
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28Claims · 4 independent
§ Ⅰ

Dossier Overview

Inventor

SunJoo Park; HakJoo Lee; WanGyu Lim; SeungMin Shin; Junli Li

IPC Classification

H1L 21/67

CPC Classification

H1L21/67017

This disclosure relates to a process gas monitoring apparatus, a volatilization vessel, a substrate processing apparatus, and a method for monitoring supply of process gas into a process chamber. The process gas comprises a chemical substance thermally decomposable to form a decomposition product, and the method comprises measuring concentration of the decomposition product in the process gas.

Original (Chinese)

This disclosure relates to a process gas monitoring apparatus, a volatilization vessel, a substrate processing apparatus, and a method for monitoring supply of process gas into a process chamber. The process gas comprises a chemical substance thermally decomposable to form a decomposition product, and the method comprises measuring concentration of the decomposition product in the process gas.

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